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Custom Solutions from Wafer Probe to Final Test

Custom Solutions from Wafer Probe to Final Test

In order to support the testing demands of a wide variety of semiconductor devices, chip and automated test equipment manufacturers depend on the design and fabrication of custom tester interface hardware from companies like Dynamic Test Solutions (DTS). Whether it’s benchtop testing for device development, wafer level product testing, or final testing of packaged integrated circuits, DTS develops testing solutions that span the semiconductor device life-cycle.

In order to meet their unique needs, DTS sought to partner with an EMS provider that could provide the flexibility to fulfill intermittent production schedules and short lead times. Over time, Naprotek has become an important manufacturing partner for DTS for both new product introduction (NPI) and repeat orders. With factories purpose-built for the batch production of complex electronic assemblies, Naprotek specializes in high-mix, low-volume builds that require real-time production feedback, flexible sourcing models, and adaptable production demand.

Read the full story in our Case Study

To learn more about Dynamic Test Solutions, visit their website

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